N-SEM/EDS
secondary electron image, back scattered electron image (COMPO, TOPO）
EDS analysis: point, line, mapping
vacuum：high vacuum, low vacuum
Example
XRD
Range of angle：2°~140º
Range of temp.：R.T.〜５００ºC
Environment：in atmosphere, in vacuum, in argon gas
Sample：powder, bulk(solid), paste
FT-IR
wavenumber ：400–4000 cm-1
Meastument method: Transmission method (tablet method), Reflection method (ATR method)
TG-DTA
Range of temp.: R.T.–1500ºC
Environment：in atmosphere, in argon gas
Spectrophotometer
